X射线萤光光谱仪(XRF)检验规范标准 下载本文

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機密等級: Confidential Level: 機密 Confidential USI Controlled Document Document Title(文件名稱) : X-Ray fluorescence test specification (X射線螢光光譜儀(XRF)檢驗規範) Document Number(文件編號): Revision(文件版本): Revise Date: Prepared by(撰寫者): Create by which Unit(制定單位) : AT-0801-M427 A6 6/26/2009 Edwin Huang 黃基泉 CQM/GRM/GD AG-0801-M006-F2 Rev.:A1

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Amendment Records

Change Description: Changed by: 1.Delete the Cr from the item of XRF test. Eric Chang 2.Add remark. 1.Add remark 3 Eric Chang Item: Date: Revision: Page: 1 03/31/2005 A2 6,7 2 04/10/2006 A3 7 3 04/10/2006 A3 6 4 05/05/2006 A1 All 5 05/05/2006 A1 6,7 包裝材料的測試值修改為: 鉛+汞+鎘+铬需Eric Chang 小於100ppm,其中需鎘小於5ppm Coding change from TT-0801-Q095 to Eric Chang TT-0801-M401 6 07/05/2006 A1 7 11/30/2006 A2 1. 修改附件一XRF測試零件及產品類別之有Eric Chang 害物質限值表規格之 Pb, Cr, Hg: 700ppm,增加Cd:60ppm之管制 2. 刪除Remark對Cr暫不設定管制上限之規定 1. Document coding change from Ken Ke All TT-0801-M401-A1 to AT-0801-M427-A1. 柯炤榕 2. Add the purpose and scope. 1. Omit that this program is practicable in Taiwan and China sites. 2. Modify Method 3: test point of PCB. 2,4,11 Edwin Huang 3. Remove Package item on attachment 1: the Cd must under 5 ppm. 10,12 1. Add halogen free and Spot test items. Edwin Huang 2. Delete Br controlling item. 8 04/29/2008 9 08/20/2008 10 09/04/2008 A3 A4 A5 1. Add attention items for the tool management process of mechanical 1,10, preparation. Edwin Huang 12~14 2. Add the flow chart and form for the management process to attachment. Updated Attachment 1: EHS threshold 10~12 value of component type for XRF test Edwin Huang word完美格式

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11 06/26/2009 A6 10 11 12 14 1. Add test method if customer request 2. Delete” IQC won’t control the threshold value of Cl.. 3. Add “If the material composed of metal, glass and ceramic. The Edwin Huang component won’t be carried out halogen free.. 4. Updated AT-0801-M427-F1 to A2 version. AG-0801-M006-F3 Rev.:A1

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